Delphi-X Observer DX.2053-PLRMi DIC

Delphi-X Observer DX.2053-PLRMi DIC

DIC accessory for Delphi-X Observer materials-science models.

The Delphi-X Observer is a state-of-the-art microscope for advanced materials-science applications. Its ergonomic design and advanced objectives make it suitable for demanding materials analysis. The 25 mm field of view of the eyepieces and plan apochromatic objectives support observations with accurate colour reproduction and high resolving power.

Eyepieces

• Super-wide-field SWF 10x/25 mm eyepieces for Ø 30 mm eyepiece holders.
• Optional extended-wide-field EWF 10x/22 mm eyepieces for Ø 30 mm eyepiece holders.

Standard head

Siedentopf trinocular head with eyepiece tubes inclined at 30°. Interpupillary distance adjustable from 47 to 78 mm. Light-distribution selector: 100:0 / 80:20 / 0:100. ±5 diopter adjustment on both eyepiece tubes. Vertical photo tube, Ø 23.2 mm.

Ergonomic head

Optional ergonomic trinocular head tilting from 0° to 35°, supplied with SWF 10x/25 mm eyepieces. Interpupillary distance adjustable from 47 to 78 mm. Light-distribution selector: 100:0 / 80:20 / 0:100. ±5 diopter adjustment on both eyepiece tubes. Vertical photo tube, Ø 23.2 mm.

Revolving nosepiece

Rotating six-position objective nosepiece on ball bearings, with a 26 mm mounting thread.

Improved Infinity Optical System (IOS)

The Delphi-X Observer™ improved Infinity Optical System (IOS) consists of super-wide-field SFWF 10x/25 mm eyepieces, high-numerical-aperture objectives with a 45 mm parfocal distance and a tube lens with a 200 mm focal length. The 200 mm tube lens reduces the angle of light rays passing through the optics, significantly improving chromatic-aberration correction and contrast. The larger-diameter objectives allow much higher numerical apertures, improving the overall resolving power of the optical system. These features give the Delphi-X Observer™ superior optical performance for the most demanding applications.

Objectives

The Delphi-X Observer™ is supplied as standard with BD plan semi-apochromatic objectives: 5x/0.15, WD 20 mm; 10x/0.30, WD 11 mm; and 20x/0.45, WD 3.1 mm. BD plan apochromatic objectives 50x/0.80, WD 1 mm, and 100x/0.90, WD 1 mm, are also specified. The following infinity-corrected brightfield/darkfield objectives are listed:

• Plan Semi-Apo (SAMi): 5x/0.15, 10x/0.30, 20x/0.45
• Plan Apo (PLAMi): 50x/0.80, 100x/0.90*
• Plan (PLMi): 2x/0.06*

* Optional. All objectives have a 45 mm parfocal distance and an M26 mounting thread. All optics receive anti-fungal and anti-reflection treatments for maximum light transmission.

Stage

Mechanical stage, 215 x 170 mm, with 105 x 105 mm travel and right-hand controls. The stage height can be lowered to accommodate samples up to 55 mm high (with the standard equipment, sample height can be 1–28 mm). The stage can be mounted in two positions.

Objective-nosepiece lowering accessory

The DX.9887 accessory lowers the objective nosepiece by 40 mm and allows the stage to be used in its lowest position.

Eyepoint riser

The DX.9885 eyepoint riser raises the eyepiece focal point by 25.4 mm.

Focusing

Coaxial coarse and fine focus. The fine-focus scale has 100 divisions, with 1 µm precision and 100 µm per rotation. Total travel is approximately 35 mm. An adjustable rack stop is supplied to prevent damage to the sample and objectives. Coarse-focus tension is adjustable. The focus knobs can be moved from left to right to suit the user.

Long-working-distance condenser

NA 0.65, long working distance of 10.2 mm, with numerical-aperture identification marks for easy adjustment.

Illumination

The Delphi-X Observer metallurgical microscope has incident and transmitted Köhler halogen illumination, 100 W, with an internal 100–240 V AC power supply and dimmable intensity. The transmitted-light system includes two neutral-density filters and a daylight filter. An analyzer and polarizer are supplied and can be inserted into the free slots of the incident illuminator to produce high-quality polarized images. A rotating cassette also enables quick switching between darkfield, brightfield and attenuated brightfield.

Optional Nomarski DIC

The redesigned DIC module greatly improves the visibility of height differences that are normally difficult to show with brightfield techniques. These relief images are ideal for inspecting surfaces such as wafers and LCD screens.

Transport and storage

The carrying handle on the rear of the microscope ensures safe transport. The integrated tool holder keeps the required tool close at hand. Storage: AE.9914-D.

Package contents

Power cable, dust cover, spare fuse, user manual and universal tool. Packed in a polystyrene box.

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