Delphi-X Observer DX.2058-PLRMi

State-of-the-art microscopes for advanced materials science applications

Ergonomic design and extraordinary state-of-the-art objectives make the Delphi-X Observer the ideal microscope for the application of advanced materials. The 25 mm field of view of the eyepieces and the plan apochromatic objectives allow observations with perfect color reproduction at high resolving power.

Eyepieces

• Super large field SWF10x/25 mm., for Ø 30 mm eyepiece holder
• Optional EWF 10x/22 mm extended field eyepieces, for Ø 30 mm eyepiece holders

STANDARD HEAD
Siedentopf design trinocular with 30° inclined eyepiece holders. Adjustable interpupillary distance between 47 and 78 mm. Light distribution selector (100:0 / 80:20 / 0:100). ± 5 diopter adjustment on both eyepieces. Vertical photo tube Ø 23.2 mm

ERGONOMIC HEAD
Optional ergonomic trinocular head tiltable between 0 and 35°, supplied with SWF 10x/25 mm eyepieces. Adjustable interpupillary distance between 47 and 78 mm. Light distribution selector (100:0 / 80:20 / 0:100). ± 5 diopter adjustment on both eyepieces. Vertical photo tube Ø 23.2 mm

REVOLVER LENS HOLDER
Sextuple rotating ball-bearing objective nosepiece with 26 mm mounting thread

IMPROVED INFINITY CORRECTION SYSTEM (IOS)
The Delphi-X Observer™ Enhanced Infinity Correction System (IOS) consists of super widefield SFWF 10x25mm eyepieces, high numerical aperture 45mm parfocal objectives, and a 200mm focal length tube lens. The 200mm focal length tube lens reduces the angle of light rays passing through the optics and as a direct result significantly improves chromatic aberration corrections and contrast. Larger diameter objectives allow for much higher numerical apertures which improve the overall resolving power of the optical system.

For all these reasons, Delphi-X Observer™ offers superior optical performance for the most demanding applications.

GOALS
The Delphi-X Observer™ is supplied as standard with BD 5x/0.15 WD 20 mm, 10x/0.30 WD 11 mm and 20x/0.45 WD 3.1 mm plan semi-apochromatic objectives BD 50x/0.80 WD 1 mm, 100x/0.90 WD 1 mm planiapochromatic objectives infinity corrected Brightfield/Darkfield objectives

* Optional
All lenses are 45mm parfocal and have a M26mm mounting thread. All optics are treated with anti-fungal and anti-reflective coating for maximum light output.

PLATEN

• Mechanical stage of 215 x 170 mm. with displacement of 105 x 105 mm. Right-handed controls
• The stage height can be lowered for large samples up to 55 mm high (with standard equipment the sample height can be 1 to 28 mm)
• The platen can be mounted in two positions:

For user ergonomics, using the optional accessory DX.9887 the stage height can be lowered working with standard height samples.

Accessory for lowering the objective-holder revolver
The DX.9887 accessory lowers the objective nosepiece by 40 mm and allows the use of the stage in its lowest position.

Eye level riser
The DX.9885 eye level riser raises the focal point of the eyepiece by 25.4 mm.

APPROACH
Coaxial macro and micrometric focusing, micrometric focusing 100 graduations, 1 µm accuracy, 100 µm per rotation, total travel range is approximately 35 mm. Supplied with adjustable rack stop to prevent damage to specimen and objectives. Coarse focusing is equipped with tension adjustment. Focusing knobs can be switched from left to right according to user preference.

LONG WORKING DISTANCE CONDENSER
AN 0.65 condenser, long working distance (10.2 mm) with numerical aperture identification marks that allow easy adjustment

LIGHTNING
The Delphi-X Observer metallographic microscope is equipped with 100W halogen Köhler incident and transmitted illumination with internal 100-240 Vac power supply and adjustable intensity. The transmitted illumination comes with two neutral density filters and one daylight filter.

The microscope comes standard with an analyzer and polarizer that can be easily inserted into the free slots of the incident illuminator to obtain high-quality polarized images. In addition, a rotating cassette is implemented to quickly switch between darkfield, brightfield and dimmed brightfield.

NOMARSKI DIC (optional)
With the redesign of the DIC module, the visualization of height differences that normally cannot be shown using brightfield techniques has been greatly improved. These relief images are ideal for surface inspections of wafers, LCD displays, etc.

( Photo : Revolver with lens holder with slot for Nomarski DIC slider )

CARRYING HANDLE
The carrying handle on the back of the microscope ensures safe transport of the microscope and the integrated tool holder ensures that the right tool is always available.

STORAGE

AE.9914-D

PACKAGE CONTENTS
Supplied with power cord, dust cover, spare fuse, user manual and universal tool. All packed in a polystyrene box.

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